Topcon SEM Workshop

Published: August 1st, 2012

Category: All News, Announcements, Electron Microscopy

This compact system simultaneously performs SEM and optical microscopy at the same location, in real time. Topcon provides the capability of a full-size SEM in a small and easy-to-use platform. Attendees are welcome and encouraged to bring samples.


This workshop will be conducted twice.

Session 1: August 14th at 9 a.m. – View Event Details

Session 2: August 15th at 9 a.m. – View Event Details



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